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USPTO Data Jan 1 1976 - Oct 20 2026
605 Patents
#7 in Kanagawa
#333 in Japan
#1,616 in the World
Anritsu Corporation
Forward Citations = 3,282
576 inventors:
Anritsu Corporation
% Expired Patents = 22.3
CIPO Patents = 1
EPO Patents = 27
Trademarks = 10
Forward Citations = 3,282
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576 inventors (with patents filed for the assignee):
Akihito Otani (21 out of 24 patents)
Takashi Kawamura (20 out of 38 patents)
Tatsuya Iwai (15 out of 15 patents)
4. Kenji Kawano (13 out of 17 patents)
5. Aiichi Katayama (13 out of 13 patents)
6. Hiroyuki Onuma (12 out of 12 patents)
7. Tasuku Teshirogi (12 out of 12 patents)
8. Takumi Nakamura (11 out of 16 patents)
9. Daiki Kano (11 out of 12 patents)
10. Takao Tanimoto (11 out of 11 patents)
11. Tomohiko Maruo (10 out of 10 patents)
12. Aya Yamamoto (10 out of 10 patents)
13. Kazunori Aoki (10 out of 10 patents)
14. Takuma Goto (10 out of 10 patents)
15. Masaya Nanami (10 out of 10 patents)
Core Competencies:
Mobile Terminal
Testing System
Error Rate Measurement
X-ray Inspection
Optical Spectrum Analyzer
Signal Generation
Measurement Device
Network Testing
Production Management
Calibration Method
Event Detection
Temperature Testing
605 patents:
Company Overview
Anritsu Corporation, headquartered in Kanagawa, Japan, specializes in advanced mobile terminal testing solutions. The company focuses on developing and manufacturing testing systems that ensure the performance and reliability of mobile devices. Its core technologies encompass error rate measurement, X-ray inspection, optical spectrum analyzers, and signal generation, catering to the needs of network testing and measurement devices. Anritsu's innovations play a critical role in enhancing communication technologies and supporting the evolving landscape of mobile connectivity.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Anritsu Corporation. Retrieved from https://idiyas.com/company/anritsu
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
1 patent (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
27 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]