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Kanagawa, Japan

Anritsu Corporation

Calculating rank

USPTO Granted Patents = 609

% Expired Patents = 22.2

CIPO Patents = 1

EPO Patents = 27

Trademarks = 10

Forward Citations = 3,307

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578 inventors (with patents filed for the assignee):

Akihito Otani (21 out of 24 patents)

Takashi Kawamura (20 out of 38 patents)

Tatsuya Iwai (15 out of 15 patents)

4. Kenji Kawano (13 out of 17 patents)

5. Aiichi Katayama (13 out of 13 patents)

6. Hiroyuki Onuma (12 out of 12 patents)

7. Tasuku Teshirogi (12 out of 12 patents)

8. Takumi Nakamura (11 out of 16 patents)

9. Daiki Kano (11 out of 12 patents)

10. Takao Tanimoto (11 out of 11 patents)

11. Tomohiko Maruo (10 out of 10 patents)

12. Aya Yamamoto (10 out of 10 patents)

13. Kazunori Aoki (10 out of 10 patents)

14. Takuma Goto (10 out of 10 patents)

15. Masaya Nanami (10 out of 10 patents)

Core Competencies:

Mobile Terminal

Testing System

Error Rate Measurement

X-ray Inspection

Optical Spectrum Analyzer

Signal Generation

Measurement Device

Network Testing

Production Management

Calibration Method

Event Detection

Temperature Testing

609 patents: Sort by Forward Citations

1. 12794605 - Error rate measurement apparatus and error rate measurement method (2026-11-10),

2. 12794460 - Differential skew generation device and differential skew generation method (2026-11-10),

3. 12785866 - Error rate measurement apparatus and error rate measurement method (2026-11-03),

4. 12776557 - Higher-order mode suppressor, waveguide filter device using same, spectrum analyzer, signal analyzer, signal generation device, higher-order mode suppression control method, and filter configuration method (2026-10-27),

5. 12772364 - X-ray generator and X-ray inspection apparatus including the same (2026-10-20),

6. 12771461 - Mobile terminal testing device and terminal information analysis method thereof (2026-10-20),

7. 12767554 - X-ray shielding material, X-ray inspection apparatus including same, and method of manufacturing X-ray shielding material (2026-10-20),

8. 12762029 - Error rate measurement apparatus and signal detection method (2026-10-13),

9. 12761258 - Spectrum analyzer and frequency marker position setting method of the same (2026-10-13),

10. 12756488 - Test system and evaluation method (2026-10-06),

11. 12736466 - Spectroscopic measurement device and article inspection device including the same (2026-09-15),

12. 12730176 - Measurement apparatus (2026-09-08),

13. 12689108 - Multiplexer, and spectrum analyzer, signal analyzer, and signal generation device using same, and multiplexer control method (2026-07-21),

14. 12684379 - Local 5G monitoring system (2026-07-14),

15. 12684378 - Local 5G monitoring system using wireless terminal (2026-07-14),

Company Overview

Anritsu Corporation, headquartered in Kanagawa, Japan, specializes in advanced mobile terminal testing solutions. The company focuses on developing and manufacturing testing systems that ensure the performance and reliability of mobile devices. Its core technologies encompass error rate measurement, X-ray inspection, optical spectrum analyzers, and signal generation, catering to the needs of network testing and measurement devices. Anritsu's innovations play a critical role in enhancing communication technologies and supporting the evolving landscape of mobile connectivity.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 10 2026

609 Patents

#7 in Kanagawa

#329 in Japan

#1,604 in the World

Kanagawa, Japan

Anritsu Corporation

Forward Citations = 3,307

578 inventors:

Akihito Otani (21 out of 24 patents)

Takashi Kawamura (20 out of 38 patents)

Tatsuya Iwai (15 out of 15 patents)

4. Kenji Kawano (13 out of 17 patents)

5. Aiichi Katayama (13 out of 13 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Anritsu Corporation. Retrieved from https://idiyas.com/company/anritsu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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