Kanagawa, Japan

Tatsuya Iwai

USPTO Granted Patents = 13 

Average Co-Inventor Count = 1.4

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2019-2025

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13 patents (USPTO):Explore Patents

Title: Tatsuya Iwai: Innovator in Error Rate Measurement Technology

Introduction

Tatsuya Iwai is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of error rate measurement technology, holding a total of 13 patents. His work focuses on enhancing the accuracy and efficiency of error rate measurements in various applications.

Latest Patents

Among his latest innovations is an error rate measurement apparatus and method. This apparatus features a provisional confidence level calculation unit that computes a provisional confidence level based on the sum of values. It also includes an upper and lower limit value update unit that adjusts the minimum and maximum values based on the calculated confidence level. Additionally, a measurement time calculation unit determines the measurement time when the sum converges within a specified range. Another notable patent involves a display unit that presents a setting screen for configuring measurement conditions, allowing users to input various parameters such as target confidence level, transmission rate, and target error rate.

Career Highlights

Tatsuya Iwai is currently employed at Anritsu Corporation, where he continues to develop innovative solutions in the field of error rate measurement. His expertise and dedication have positioned him as a key figure in advancing measurement technologies.

Collaborations

Throughout his career, Tatsuya has collaborated with notable colleagues, including Hironori Yoshioka and Tomoaki Kabasawa. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Tatsuya Iwai's contributions to error rate measurement technology exemplify his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in measurement processes, making him a valuable asset in his field.

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