The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Apr. 10, 2024
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Hironori Yoshioka, Kanagawa, JP;

Tatsuya Iwai, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3171 (2013.01); G01R 31/318572 (2013.01);
Abstract

An error rate measurement apparatus includes a provisional confidence level calculation unit that calculates a provisional confidence level CLx by using the sum x, an upper and lower limit value update unit that substitutes the sum x for the variable min_x in a case where the provisional confidence level CLx is equal to or lower than a target confidence level CL, and substitutes the sum x for the variable max_x in a case where the provisional confidence level CLx is higher than the target confidence level CL, and a measurement time calculation unit that calculates, in a case where changes in a value of the sum x calculated by the average value calculation unit are converged in a predetermined range, a value obtained by dividing the converged sum x by a product of a data rate and a target error rate ER, as the measurement time.


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