The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Apr. 09, 2024
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Tatsuya Iwai, Kanagawa, JP;

Hironori Yoshioka, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3171 (2013.01); G01R 31/2841 (2013.01);
Abstract

An error rate measurement apparatus includes a display unit that displays a setting screen for setting a measurement condition of an error rate of an input signal from a DUT, and a processing unit that calculates a measurement time based on the measurement condition input to the setting screen, in which the setting screen includes a target confidence level input portion for inputting a target confidence level, a transmission rate input portion for inputting a transmission rate, a target error rate input portion for inputting a target error rate, an assumed-number-of-errors input portion for inputting an assumed number of errors during the measurement time, and a measurement time display portion for displaying the measurement time.


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