The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2013
Filed:
Jan. 21, 2010
Seiya Suzuki, Atsugi, JP;
Takashi Aoki, Atsugi, JP;
Ken Mochizuki, Atsugi, JP;
Anritsu Corporation, Atsugi-shi, JP;
Abstract
An apparatus for rapidly measuring jitter transfer characteristics is provided. A modulation signal generator generates a modulation signal M including a plurality of sinusoidal components having known amplitudes mto mand different frequencies fto f, and outputs the modulation signal M to a jitter generator. A clock signal C phase-modulated by the modulation signal M is input to a data signal generator, a data signal D synchronized with the clock signal C is provided to a measurement object, a data signal D' output from the measurement object is input to a clock recovery unit to recover a clock signal component C′, and the clock signal component C′ is phase-detected by a phase detector. A signal amplitude detector detects the amplitudes of the plurality of sinusoidal components included in the modulation signal M from an output signal M′ of the phase detector, and an operation processor calculates a ratio of the detected amplitudes and the known amplitudes for each of the sinusoidal components, respectively.