The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8208586 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 26, 2012

Filed:

Mar. 24, 2010
Applicants:

Naosuke Tsuchiya, Atsugi, JP;

Ken Mochizuki, Agsugi, JP;

Seiya Suzuki, Atsugi, JP;

Inventors:

Naosuke Tsuchiya, Atsugi, JP;

Ken Mochizuki, Agsugi, JP;

Seiya Suzuki, Atsugi, JP;

Assignee:

Anritsu Corporation, Atsugi-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

It is an object of the invention to correctly display the waveform of a demodulation signal with a single apparatus. A jitter demodulator which demodulates a jitter component of a digital signal input from the outside, a jitter amount detector which detects the amplitude value of a demodulation signal output from the jitter demodulator, an interpolator which measures a period of the demodulation signal output from the jitter demodulator and interpolates the demodulation signal processing with a rate corresponding to the measured period, a display unit, and a display control section which displays on the display unit the value detected by the jitter amount detector and a waveform of the demodulation signal interpolated by the interpolator are provided in a single housing.


Find Patent Forward Citations

Tsuchiya, Naosuke. (2012). Jitter measuring apparatus (U.S. Patent No. 8208586). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8208586

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…