Seiji Sasaki

Title: Seiji Sasaki: Innovator in X-ray Measurement Technology

Introduction

Seiji Sasaki is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of X-ray measurement technology, holding a total of 6 patents. His innovative approaches have enhanced the accuracy and efficiency of X-ray measuring devices.

Latest Patents

Sasaki's latest patents include a calibration method for X-ray measuring devices. This method involves mounting a calibration tool on a rotating table and identifying centroid positions from the output of an X-ray image detector. By calculating projection transformation matrices from these centroid positions and known relative positional intervals, the method allows for the easy calculation of the rotation center position of the rotating table. This process simplifies the calibration of X-ray measuring devices, making it more efficient and user-friendly.

Another notable patent is the calibration method of an X-ray measuring device, which includes several steps such as moving position acquisition, relative position calculation, and center position calculation. This comprehensive approach ensures precise measurements and enhances the overall functionality of X-ray measuring systems.

Career Highlights

Throughout his career, Seiji Sasaki has worked with esteemed organizations such as Mitutoyo Corporation and the University of Tokyo. His experience in these institutions has allowed him to develop and refine his innovative techniques in X-ray measurement technology.

Collaborations

Sasaki has collaborated with notable colleagues, including Masato Kon and Hiromu Maie. Their combined expertise has contributed to the advancement of X-ray measurement methodologies.

Conclusion

Seiji Sasaki's contributions to X-ray measurement technology through his patents and collaborations highlight his role as a leading inventor in this field. His innovative methods continue to influence the industry and improve measurement accuracy.