The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Apr. 09, 2024
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventors:

Seiji Sasaki, Saitama, JP;

Kazuhiko Hidaka, Tokyo, JP;

Daisuke Sakai, Saitama, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/12 (2006.01); G01B 3/00 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0099 (2013.01); G01B 3/008 (2013.01); G01B 5/12 (2013.01); G01N 35/00584 (2013.01);
Abstract

There is provided an automatic measuring system that can automate measurement and a control method for automatic measurement. An automatic measuring system includes a measuring sensor tool that detects a surface of an object to be measured with a probe to measure a dimension or a shape of the object to be measured, and a multi-axis moving mechanism that relatively moves the measuring sensor tool with respect to the object to be measured. The measuring sensor tool includes a cover part to protect the probe. In an approaching step in which the moving mechanism causes the measuring sensor tool to approach a point to be measured of the object to be measured, the cover part accommodates the probe inside the cover part. After the approaching step is completed, the probe is exposed from the cover part to detect the surface of the object to be measured.


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