The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2026

Filed:

Apr. 10, 2024
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventors:

Daisuke Sakai, Saitama, JP;

Seiji Sasaki, Saitama, JP;

Kunio Ueda, Kanagawa, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G01B 5/20 (2006.01); G01N 35/00 (2006.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G01B 5/20 (2013.01); G01N 35/0099 (2013.01); G06T 7/60 (2013.01); G06T 2207/30204 (2013.01);
Abstract

An automatic measuring system includes a measuring sensor tool that detects a surface of an object to be measured to measure a dimension or a shape of the object to be measured, a moving mechanism that relatively moves the measuring sensor tool with respect to the object to be measured, and an observation camera that images the object to be measured. A position and an orientation (posture) of a point to be measured are acquired from image data obtained by imaging the object to be measured by the observation camera, the measuring sensor tool is caused by the moving mechanism to approach the point to be measured, taking into account a position and posture offset between the observation camera and the measuring sensor tool, and a measurement value of the point to be measured is acquired by the measuring sensor tool.


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