The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2022
Filed:
Sep. 09, 2020
Mitutoyo Corporation, Kanagawa, JP;
Masato Kon, Kanagawa, JP;
Hiromu Maie, Kanagawa, JP;
Seiji Sasaki, Kanagawa, JP;
Jyota Miyakura, Kanagawa, JP;
MITUTOYO CORPORATION, Kanagawa, JP;
Abstract
A calibration method of an X-ray measuring device includes: mounting a calibration toolon a rotating table; a moving position acquisition step of parallelly moving a position of an j-th spherewith respect to a position of a first sphere, irradiating the calibration toolwith an X-ray, and acquiring, form an output of an X-ray image detector, a moving position Mj where the magnitude of a differential position Erjofa centroid position ImDisjh_Sphr_j of a projected image of the j(2£j£N)-th spherewith respect to a centroid position ImDis1_Sphr_1 of a projected image of the first spherebecomes equal to or less than a specified value Vx; a relative position calculation step of performing the moving position acquisition step on the remaining spheres; a feature position calculation step; a transformation matrix calculation step; a rotation detection step; a position calculation step; and a center position calculation step.