Kanagawa, Japan

Hiromu Maie


Average Co-Inventor Count = 3.5

ph-index = 1

Forward Citations = 3(Granted Patents)


Location History:

  • Kanagwa, JP (2019)
  • Kawasaki, JP (2021)
  • Ibaraki, JP (2022)
  • Kanagawa, JP (2022 - 2023)

Company Filing History:


Years Active: 2019-2023

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6 patents (USPTO):Explore Patents

Title: Hiromu Maie: Innovator in X-ray Measurement and Lens Technology

Introduction

Hiromu Maie is a distinguished inventor based in Kanagawa, Japan. He has made significant contributions to the fields of X-ray measurement and lens technology, holding a total of six patents. His innovative approaches have led to advancements that enhance the precision and efficiency of measurement devices.

Latest Patents

One of Maie's latest patents is a calibration method for an X-ray measuring device. This method involves mounting a calibration tool on a rotating table and identifying centroid positions from the output of an X-ray image detector. By calculating projection transformation matrixes from these centroid positions and known relative positional intervals, the method allows for easy calculation of the rotation center position of the rotating table. This process simplifies the calibration of devices used for measuring objects in a rotatable manner.

Another notable invention is the lens substrate stacking position calculating apparatus and program. This apparatus is designed to calculate the optimal stacking position for multiple wafer lens arrays, ensuring that the optical axis deviation of the lens sets remains within an allowable range. By calculating the positional relationship of the transparent substrates, the apparatus maximizes the number of lens sets that can be bonded together effectively.

Career Highlights

Hiromu Maie is currently employed at Mitutoyo Corporation, a leading company in precision measurement technology. His work at Mitutoyo has allowed him to apply his innovative ideas in practical applications, contributing to the company's reputation for excellence in measurement solutions.

Collaborations

Throughout his career, Maie has collaborated with talented individuals such as Jyota Miyakura and Masato Kon. These collaborations have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Hiromu Maie's contributions to the fields of X-ray measurement and lens technology exemplify his innovative spirit and dedication to advancing measurement solutions. His patents reflect a commitment to enhancing precision and efficiency in various applications.

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