Raleigh, NC, United States of America

Scott Burroughs

This inventor holds 18 USPTO granted patents and 16 published patent applications and 5 EPO patents, primarily in Lidar Technology. Top assignees: Sense Photonics, Inc., X-Celeprint Limited, Semprius, Inc.. Active years: 2014-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Scott Burroughs. Retrieved from https://idiyas.com/inventor/scott-burroughs

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 18 

% Patents Active = 77.8

 

Average Co-Inventor Count = 3.3

ph-index = 2

Forward Citations = 16(Granted Patents)


Location History:

  • Durham, NC (US) (2014 - 2019)
  • Raleigh, NC (US) (2016 - 2024)

Company Filing History:


Years Active: 2014-2025

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Areas of Expertise:
Lidar
Image-Sensor Devices
VCSEL
Autonomous Vehicles
Beam Shaping
Photovoltaics
Semiconductor Epitaxy
High-Resolution
Flash Lidar
Safety Layers
Integrated Detectors
Beam Steering
18 patents (USPTO):Explore Patents

Title: Top Inventor in Raleigh, NC

Introduction

Russell Speight VanBlon is recognized as a leading inventor based in Raleigh, North Carolina. His contributions to various fields have garnered attention and respect within the innovation community.

Latest Patents

Russell has recently been awarded several patents that showcase his inventive prowess and commitment to advancing technology.

Career Highlights

Throughout his career, Russell has achieved significant milestones, including collaborations with prominent companies and institutions, further solidifying his reputation as a top inventor.

Collaborations

He has partnered with various organizations to bring his innovative ideas to fruition, demonstrating his ability to work effectively in team environments.

Conclusion

Russell Speight VanBlon continues to inspire future generations of inventors with his groundbreaking work and dedication to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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