Tokyo, Japan

Sayaka Kurata

USPTO Granted Patents = 4 

 

Average Co-Inventor Count = 3.7

ph-index = 1


Company Filing History:


Years Active: 2019-2025

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4 patents (USPTO):

Title: Sayaka Kurata: Innovator in Microstructure Evaluation Systems

Introduction

Sayaka Kurata is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of microstructure evaluation, holding a total of 4 patents. Her innovative work focuses on enhancing imaging techniques and measurement systems.

Latest Patents

One of her latest patents is a microstructure evaluation system and sample image imaging method. This system is designed to detect fluctuations caused by imaging devices. It includes a feature data extraction unit that captures images while changing the observation field of view on a sample. Additionally, a fluctuation evaluation unit calculates long-term fluctuations of the captured data and re-captures images when necessary. This ensures accurate evaluation by determining if fluctuations are caused by the imaging device.

Another notable patent is a measurement system and method for setting observation conditions of measurement apparatus. This system comprises a measurement apparatus that observes samples based on specific observation conditions. It utilizes an observation condition database to store relevant data and calculate candidate observation conditions for target samples. This innovative approach streamlines the process of setting up measurements.

Career Highlights

Sayaka Kurata has worked with reputable companies such as Hitachi, Ltd. and Hitachi High-Tech Corporation. Her experience in these organizations has allowed her to develop and refine her innovative ideas in the field of microstructure evaluation.

Collaborations

Throughout her career, Sayaka has collaborated with notable colleagues, including Momoyo Enyama and Yasuhiro Shirasaki. These collaborations have contributed to her success and the advancement of her inventions.

Conclusion

Sayaka Kurata is a remarkable inventor whose work in microstructure evaluation systems has made a significant impact in her field. Her innovative patents and career achievements highlight her dedication to advancing technology.

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