The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Feb. 26, 2021
Hitachi, Ltd., Tokyo, JP;
Hiroyuki Suzuki, Tokyo, JP;
Sayaka Kurata, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
A spectral analysis unit receives items of spectral data acquired by a measurement device with regards to a material according to a prescribed measurement condition, and calculates spectral feature amounts of the spectral data using a model function. A standard deviation acquisition unit estimates, on the basis of the spectral feature amounts, the standard deviation between the model function and the values actually measured by the measurement device; and a feature amount error-identification accuracy degree relationship analysis unit calculates, for each of the spectral feature amounts, an identification accuracy degree in relation to identifying the material, using spectral feature amount-material identifier correlation information indicating the correspondence relationship for the material identifier in question, and generates, using the identification accuracy degree and the standard deviation, feature amount error-identification accuracy degree correlation information indicating the correlation relationship between the identification accuracy degree and the spectral feature amount error for the material.