Sanghyeon Baeg

Title: The Innovative Contributions of Sanghyeon Baeg

Introduction

Sanghyeon Baeg is a notable inventor based in Cupertino, CA, who has made significant contributions to the field of integrated circuit design. With a total of 4 patents to his name, Baeg's work focuses on enhancing the functionality and efficiency of electronic components.

Latest Patents

One of Baeg's latest patents is titled "Adaptable scan chains for debugging and manufacturing test purposes." This innovation allows scan chains to be configured in multiple modes, supporting both debugging and manufacturing tests for integrated circuit chips. The transition between these modes is facilitated by private instructions in a JTAG controller, adhering to the IEEE 1149.1 standard. Another significant patent is the "Low cost emulation scheme implemented via clock control using JTAG." This patent describes an integrated circuit that operates at different clock speeds for testing and functional logic blocks. It includes a control register that can be written to via a serial shift operation, allowing for efficient emulation tasks while maintaining constant outputs during operations.

Career Highlights

Sanghyeon Baeg is currently employed at Samsung Electronics Co., Ltd., where he continues to push the boundaries of technology through his innovative designs. His work has been instrumental in improving the performance and reliability of integrated circuits.

Collaborations

Baeg has collaborated with esteemed colleagues such as Edward H. Yu and Amjad Z. Qureshi, contributing to a dynamic environment of innovation and creativity.

Conclusion

Sanghyeon Baeg's contributions to the field of integrated circuits exemplify the spirit of innovation. His patents not only enhance the functionality of electronic devices but also pave the way for future advancements in technology.