The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 1998

Filed:

Nov. 15, 1996
Applicant:
Inventor:

Sanghyeon Baeg, Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 2231 ; 371 2236 ;
Abstract

An integrated circuit includes a test port operating at a first clock speed and at least one functional logic block operating at a second clock speed which is faster than the first clock speed. A control register, formed by boundary scan cells, operates at the first clock speed and provides control inputs to the functional block to control emulation tasks. The control register is writable via a serial shift operation through the test port while the functional block is operating. The outputs of the control register which are being provided to the functional block are held constant during the serial shift operation. An observation register, formed by boundary scan cells, operates at the first clock speed, and is readable through the test port via a serial shift operation, while the functional block is operating. The observation register receives signals from the functional block indicating status of the functional block.


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