The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2000
Filed:
Oct. 18, 1996
Applicant:
Inventor:
Sanghyeon Baeg, Cupertino, CA (US);
Assignee:
Samsung Electronics Co., Ltd., Seoul, KR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
714726 ; 365201 ;
Abstract
Scan chains to support debugging and manufacturing test modes for integrated circuit chips are made adaptable. Scan chains may be configured either in a multiple scan chain JTAG mode or in a multiple independent and parallel scan chain mode. The configuration transition between the scan modes is made by private instructions implemented in a JTAG controller, which supports the IEEE 1149.1 standard.