The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 1998
Filed:
Oct. 18, 1996
Applicant:
Inventors:
Amjad Qureshi, San Jose, CA (US);
Sanghyeon Baeg, Cupertino, CA (US);
Assignee:
Samsung Electronics Co., Ltd., Seoul, KR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 221 ; 39518318 ;
Abstract
JTAG test logic and a memory controller place an SDRAM in a self refresh mode prior to beginning JTAG testing. The memory controller can complete a current memory access and otherwise prepare for the JTAG test. During the JTAG test, self refresh mode operation of the SDRAM retains data without the need for a clock signal or refresh signals which are suspended for the JTAG test. Accordingly, after the JTAG test, circuit operation can continue without reinitializing data in the SDRAM.