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1 out of 832,843 Years Active: 2000-2016
Title: Rajesh Raina: Innovator in Memory Testing Technologies
Introduction
Rajesh Raina is a notable inventor based in Austin, TX, who has made significant contributions to the field of memory testing technologies. With a total of 4 patents to his name, Raina has developed innovative systems and methods that enhance the reliability and efficiency of multiport memories.
Latest Patents
One of Raina's latest patents is titled "System and method for testing address-swap faults in multiport memories." This invention provides a comprehensive approach to detecting address-swap faults, inversion faults, and bit-swap faults in multiport memory systems. The method includes various testing types, such as pass/fail and diagnostic testing, to identify faulty ports and correct inverted address bits. This testing method can be implemented during manufacturing tests or function design verification.
Another significant patent by Raina is "Efficient apparatus and method for testing digital shadow logic around non-logic design structures." This invention introduces a circuit that allows for the isolated testing of digital shadow logic, enabling flexible emulation of non-logic design structures. The circuit includes a width and delay matched bypass circuit that generates test outputs, facilitating separate tests on both shadow logic and non-logic design structures.
Career Highlights
Throughout his career, Rajesh Raina has worked with prominent companies such as Freescale Semiconductor, Inc. and Motorola Corporation. His experience in these organizations has contributed to his expertise in memory technologies and testing methodologies.
Collaborations
Raina has collaborated with notable professionals in the field, including Magdy Samuel Abadir and Robert F. Molyneaux. These collaborations have further enriched his work and innovations in memory testing.
Conclusion
Rajesh Raina's contributions to memory testing technologies through his patents and career experiences highlight his role as an influential inventor in the industry. His innovative approaches continue to shape the future of memory systems and testing methodologies.