The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Jun. 24, 2014
Freescale Semiconductor, Inc., Austin, TX (US);
Rajesh Raina, Austin, TX (US);
Magdy S. Abadir, Austin, TX (US);
FREESCALE SEMICONDUCTOR, INC., Austin, TX (US);
Abstract
A system method of detecting address-swap faults in a multiport memory as described herein includes minimum testing for inversion faults and bit-swap faults for each port of the multiport memory. Different test types may be performed for inversion and bit-swap including pass/fail, and diagnostic testing for locating faulty ports. Pass/fail testing may be used for identifying whether the IC is good or bad, and additional diagnostic testing using additional cycles may be used for disabling faulty ports or correcting inverted address bits. The test method may be implemented as a function test or as a memory built-in self-test. The test method may be used during manufacturing test or during function design verification.