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For the Inventor, By the Inventor

Tapah, Malaysia

R Selvakumar Raja Gopal

This inventor holds 6 USPTO granted patents and 1 published patent application. Top assignee: Intel Corporation. Active years: 2018-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: R Selvakumar Raja Gopal. Retrieved from https://idiyas.com/inventor/r-selvakumar-raja-gopal

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 6 

% Patents Active = 100.0

Average Co-Inventor Count = 3.1

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:

goldMedal6 out of 56,290 
 
Intel Corporation
 patents

Years Active: 2018-2023

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6 patents (USPTO):Explore Patents
1. 11686767 - System, apparatus and method for functional testing of one or more fabrics of a processor (2023-06-27),
2. 11335428 - Methods, systems and apparatus for in-field testing for generic diagnostic components (2022-05-17),
3. 11250167 - Secure external SoC debugging (2022-02-15),
4. 11073554 - Hardware-based local-state retention fault detection (2021-07-27),
5. 10928449 - Apparatus for memory built-in self-test with error detection and correction code awareness (2021-02-23),
6. 10042729 - Apparatus and method for a scalable test engine (2018-08-07),

Title: R Selvakumar Raja Gopal: Innovator in Fabric Testing Technologies

Introduction

R Selvakumar Raja Gopal is a notable inventor based in Tapah, Malaysia. He has made significant contributions to the field of technology, particularly in the area of fabric testing systems. With a total of 6 patents to his name, his work has garnered attention for its innovative approaches and practical applications.

Latest Patents

One of his latest patents is titled "System, apparatus and method for functional testing of one or more fabrics of a processor." This invention includes an apparatus that features at least one fabric interfacing with multiple intellectual property (IP) blocks. The fabric comprises a status storage and a fabric bridge controller, which initiates functional safety tests in response to specific signals. The results of these tests are then compiled into a test report for further analysis.

Another significant patent is "Methods, systems and apparatus for in-field testing for generic diagnostic components." This invention focuses on testing memory circuitry and diagnostic components, utilizing Memory Built-In Self-Test (MBIST) to identify memory failures. The implementation of Error Correction Code (ECC) and Parity ensures protection against faults during runtime, enhancing the reliability of memory structures.

Career Highlights

R Selvakumar Raja Gopal is currently employed at Intel Corporation, where he continues to innovate and develop new technologies. His work at Intel has positioned him as a key player in advancing testing methodologies for fabric and memory systems.

Collaborations

He collaborates with talented coworkers, including Asad Azam and Kaitlyn Chen, who contribute to the development and refinement of his inventions. Their teamwork fosters an environment of creativity and innovation, leading to groundbreaking advancements in technology.

Conclusion

R Selvakumar Raja Gopal's contributions to fabric testing technologies exemplify the spirit of innovation. His patents reflect a commitment to enhancing the reliability and functionality of electronic systems. Through his work at Intel Corporation, he continues to push the boundaries of technology, making a lasting impact in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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