The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Apr. 01, 2016
Lakshminarayana Pappu, Folsom, CA (US);
Robert DE Gruijl, San Francisco, CA (US);
Suketu U. Bhatt, Folsom, CA (US);
Robert P. Adler, Santa Clara, CA (US);
R Selvakumar Raja Gopal, Tapah, MY;
Rius Tanadi, Sacramento, CA (US);
Lakshminarayana Pappu, Folsom, CA (US);
Robert De Gruijl, San Francisco, CA (US);
Suketu U. Bhatt, Folsom, CA (US);
Robert P. Adler, Santa Clara, CA (US);
R Selvakumar Raja Gopal, Tapah, MY;
Rius Tanadi, Sacramento, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
An apparatus and method are described for a scalable testing agent. For example, one embodiment of a scalable test engine comprises: an input interface to receive commands and/or data from a processor core or an external test system, the commands and/or data to specify one or more test operations to be performed on one or more intellectual property (IP) blocks of a chip; a first circuit to establish communication with an IP block over an interconnect fabric, the first circuit to transmit the one or more test operations to the IP block responsive to the received commands and/or data, the IP block to process the test operations and generate results; and a second circuit to receive the results from the IP block over the interconnect fabric, the results to be provided from the second circuit to the processor core and/or the external test system for analysis.