This inventor holds 5 USPTO granted patents and 1 EPO patent. Top assignees: Kla Corporation, Kla Tencor Corporation. Active years: 2018-2025.
Company Filing History:
Years Active: 2018-2025
Title: Innovations of Premchandra M Shankar
Introduction
Premchandra M Shankar is a notable inventor based in Fremont, CA (US). He has made significant contributions to the field of image processing and semiconductor inspection. With a total of 5 patents to his name, his work has had a considerable impact on technology.
Latest Patents
One of his latest patents is focused on salient feature point-based image alignment. This method involves selecting three or more salient feature points for aligning a test image to a reference image. By applying a salient feature point detection method, the inventor ensures accurate alignment of images, which is crucial in various applications. Another significant patent is related to equi-probability defect detection for semiconductor inspection images. This innovation allows for the determination of detection thresholds based on probability density functions at pixel intensity levels. By estimating the probability distribution of underlying data, the method can effectively identify outliers and optimize laser power based on detection thresholds.
Career Highlights
Throughout his career, Premchandra has worked with prominent companies such as KLA Corporation and KLA-Tencor Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in technology.
Collaborations
Premchandra has collaborated with talented individuals in his field, including Ashok Varadarajan and Jie Gong. Their combined expertise has fostered a creative environment that has led to groundbreaking innovations.
Conclusion
Premchandra M Shankar's contributions to image processing and semiconductor inspection demonstrate his commitment to innovation. His patents reflect a deep understanding of technology and its applications, making him a valuable figure in the field.

