Dashe, Taiwan

Po-Yao Ke

USPTO Granted Patents = 5 

Average Co-Inventor Count = 4.0

ph-index = 4

Forward Citations = 91(Granted Patents)


Location History:

  • Kaohsiung County, TW (2013)
  • Dashe Township, TW (2012 - 2015)

Company Filing History:


Years Active: 2012-2015

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5 patents (USPTO):Explore Patents

Title: Po-Yao Ke: Innovator in Semiconductor Technology

Introduction

Po-Yao Ke is a prominent inventor based in Dashe, Taiwan. He has made significant contributions to the field of semiconductor technology, holding a total of 5 patents. His work focuses on innovative solutions that enhance the performance and reliability of electronic devices.

Latest Patents

Among his latest patents is an electrical fuse and related applications. In various embodiments, the fuse is formed from silicide and is situated on top of a fin structure. This design allows the fuse to have a very thin width, matching that of the fin. The thin width ensures that a predetermined current can reliably cause the fuse to open. Additionally, this fuse can be integrated with a transistor to create a memory cell used in memory arrays, utilizing FinFET technology. Another notable patent involves methods of fabricating bipolar junction transistors with fins. This method includes forming a first fin above a substrate and creating various regions within the fin to enhance the functionality of the semiconductor device.

Career Highlights

Po-Yao Ke is currently employed at Taiwan Semiconductor Manufacturing Company Limited, where he continues to push the boundaries of semiconductor innovation. His expertise in the field has led to advancements that are crucial for modern electronic applications.

Collaborations

He has collaborated with notable coworkers, including Shine Chien Chung and Tao-Wen Chung, contributing to a dynamic and innovative work environment.

Conclusion

Po-Yao Ke's contributions to semiconductor technology exemplify the spirit of innovation. His patents reflect a commitment to advancing electronic device performance and reliability.

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