Santa Fe, NM, United States of America

Paul Frank Luehrmann



Average Co-Inventor Count = 8.1

ph-index = 5

Forward Citations = 154(Granted Patents)


Location History:

  • Sante Fe, NM (US) (2010 - 2014)
  • Eindhoven, NL (2016 - 2017)
  • Veldhoven, NL (2018)
  • Santa FE, NM (US) (2006 - 2022)

Company Filing History:


Years Active: 2006-2022

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13 patents (USPTO):Explore Patents

Title: Unveiling the Innovations of Paul Frank Luehrmann

Introduction:

Paul Frank Luehrmann, a distinguished inventor based in Santa Fe, NM, has made remarkable contributions to the field of angular-resolved spectroscopic lithography characterization. With a portfolio boasting 13 patents, his groundbreaking work continues to redefine technological boundaries.

Latest Patents:

Luehrmann's latest patents showcase his expertise in developing cutting-edge methods and apparatus for angular-resolved spectroscopic lithography characterization. These inventions involve measuring angle-resolved spectra in the pupil plane of high numerical aperture lenses, providing valuable insights into substrate properties, including angle and wavelength dependencies, as well as the intensity and phase differences of TM- and TE-polarized radiation.

Career Highlights:

Currently affiliated with ASML Netherlands B.V., a renowned technology company at the forefront of innovation in the semiconductor industry, Luehrmann's role is pivotal in driving forward advancements in lithography characterization. His strategic vision and technical acumen have led to the successful implementation of novel processes that have revolutionized the industry.

Collaborations:

In his professional journey, Luehrmann has collaborated closely with esteemed colleagues such as Arie Jeffrey Den Boef and Mircea Dusa. Together, they have synergized their expertise to overcome challenges and propel their collective vision towards creating impactful solutions in the realm of lithography characterization.

Conclusion:

In conclusion, Paul Frank Luehrmann stands as a beacon of innovation and ingenuity in the realm of angular-resolved spectroscopic lithography characterization. His relentless pursuit of excellence, coupled with his unwavering commitment to pushing boundaries, continues to inspire the next generation of inventors and technologists. As he navigates the ever-evolving landscape of technological advancements, Luehrmann's contributions will undoubtedly leave a lasting imprint on the industry for years to come.

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