Shiga, Japan

Osamu Hirose

USPTO Granted Patents = 11 

 

Average Co-Inventor Count = 1.6

ph-index = 4

Forward Citations = 35(Granted Patents)


Location History:

  • Shiga, JP (2011 - 2013)
  • Ritto, JP (2007 - 2020)
  • Kawasaki, JP (2009 - 2020)

Company Filing History:


Years Active: 2007-2025

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11 patents (USPTO):Explore Patents

Title: Osamu Hirose: Innovator in X-ray Inspection Technology

Introduction

Osamu Hirose is a prominent inventor based in Shiga, Japan, known for his significant contributions to the field of X-ray inspection technology. With a total of 11 patents to his name, Hirose has developed innovative devices that enhance the accuracy and efficiency of X-ray inspections.

Latest Patents

Hirose's latest patents include an advanced X-ray inspection device and an X-ray examination device. The X-ray inspection device features a transport unit, an X-ray irradiation unit, and an X-ray detection unit that operates across multiple energy bands. This device generates a series of X-ray transmission images, allowing for the detection of foreign matter based on specific gravity thresholds. The X-ray examination device incorporates a conveyance unit and a sophisticated image processing unit that performs edge detection and gradation processing to produce high-quality images for analysis.

Career Highlights

Throughout his career, Osamu Hirose has worked with notable companies such as Ishida Co. Limited and Job Corporation. His experience in these organizations has contributed to his expertise in developing cutting-edge inspection technologies.

Collaborations

Hirose has collaborated with talented individuals in the field, including Takashi Kabumoto and Yoshinori Tarumoto. Their combined efforts have led to advancements in X-ray inspection methodologies.

Conclusion

Osamu Hirose's innovative work in X-ray inspection technology has made a significant impact on the industry. His patents reflect a commitment to improving safety and efficiency in various applications.

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