The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Jan. 20, 2023
Ishida Co., Ltd., Kyoto, JP;
Ken Iwakawa, Ritto, JP;
Osamu Hirose, Ritto, JP;
ISHIDA CO., LTD., Kyoto, JP;
Abstract
An X-ray inspection device includes a transport unit, an X-ray irradiation unit configured to irradiate an article with X-rays, an X-ray detection unit configured to detect the X-rays in each of a plurality of energy bands, an X-ray transmission image generation unit configured to generate a plurality of X-ray transmission images on the basis of the X-rays in each of the plurality of energy bands, and an inspection unit configured to inspect whether or not a foreign matter is present or absent in the article on the basis of a difference image between the plurality of generated X-ray transmission images. The inspection unit detects a first foreign matter having a higher specific gravity than the article using a first threshold value and detects a second foreign matter having a lower specific gravity than the article using a second threshold value different from the first threshold value.