Ken Iwakawa

Title: Ken Iwakawa: Innovator in X-ray Inspection Technology

Introduction

Ken Iwakawa is a notable inventor based in Ritto, Japan. He has made significant contributions to the field of X-ray inspection technology, holding a total of 5 patents. His innovative work focuses on enhancing the accuracy and efficiency of X-ray inspection devices.

Latest Patents

One of Ken Iwakawa's latest patents is an X-ray inspection device that includes a transport unit, an X-ray irradiation unit, and an X-ray detection unit. This device is designed to detect foreign matter in articles by generating a difference image based on multiple X-ray transmission images. The inspection unit can identify foreign matter with varying specific gravities using different threshold values. Another significant patent is an X-ray inspection apparatus that utilizes a photon counting method to classify detected X-rays into multiple energy regions. This apparatus also features a threshold value setting unit that adjusts the threshold based on the gradations of the generated X-ray transmission images.

Career Highlights

Ken Iwakawa is currently employed at Ishida Co. Limited, where he continues to develop advanced inspection technologies. His work has been instrumental in improving the reliability of X-ray inspection systems used in various industries.

Collaborations

Ken collaborates with talented coworkers, including Emi Mizuno and Futoshi Yurugi, who contribute to the innovative projects at Ishida Co. Limited.

Conclusion

Ken Iwakawa's contributions to X-ray inspection technology demonstrate his commitment to innovation and excellence in the field. His patents reflect a deep understanding of the complexities involved in detecting foreign matter, making significant strides in ensuring product safety and quality.