The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Feb. 10, 2023
Ishida Co., Ltd., Kyoto, JP;
ISHIDA CO., LTD., Kyoto, JP;
Abstract
An X-ray inspection apparatus includes: a transport unit configured to transport an article; an X-ray source configured to irradiate the article with X-rays; an X-ray detection unit configured to detect the X-rays using a photon counting method and to classify photon energy of the detected X-rays into two or more energy regions on the basis of a threshold value; a threshold value setting unit configured to set the threshold value; an X-ray image generation unit configured to generate two or more X-ray transmission images corresponding to the two or more energy regions on the basis of a detection result of the X-rays; and an inspection unit configured to inspect the article on the basis of the X-rays. The threshold value setting unit is configured to set the threshold value on the basis of gradations of the two or more X-ray transmission images.