The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Jan. 26, 2023
Applicant:
Ishida Co., Ltd., Kyoto, JP;
Inventors:
Assignee:
ISHIDA CO., LTD., Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G01N 23/083 (2018.01); G01N 23/18 (2018.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); G01N 23/083 (2013.01); G01N 23/18 (2013.01); G01N 2223/04 (2013.01); G01N 2223/50 (2013.01); G01N 2223/646 (2013.01); G01N 2223/652 (2013.01);
Abstract
An X-ray inspection apparatus includes an X-ray source configured to irradiate an article with X-rays in a plurality of energy bands, an X-ray detection unit capable of detecting the X-rays by a photon counting method, an image generation unit configured to generate an overall transmission image corresponding to the X-rays in all of the plurality of energy bands and a transmission image corresponding to the X-rays in some of the plurality of energy bands on the basis of a detection result of the X-rays by the X-ray detection unit, and an inspection unit configured to inspect the article on the basis of the overall transmission image and the transmission image.