The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2007
Filed:
Apr. 19, 2006
Osamu Hirose, Ritto, JP;
Osamu Hirose, Ritto, JP;
Ishida Co., Ltd., Kyoto, JP;
Abstract
An X-ray inspection apparatus is disclosed. An inside area defining unit defines an area inside the rim of the can in an X-ray image created by an image formation unit. An extension area defining unit rotates a circle such that the circle externally touches the above-mentioned area, and defines an extension area whose boundary is the locus of the center of the externally touching circle. A reduction area defining unit rotates a circle having the same radius such that it internally touches the extension area, and defines a reduction area whose boundary is the locus of the center of the internally touching circle. A mask area defining unit defines a region outside the boundary of the reduction area as a mask area, and the first contaminant detection unit performs an inspection for contamination in an inspection area inside the mask area defined by an inspection area defining unit.