The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2009
Filed:
Mar. 25, 2005
Applicant:
Osamu Hirose, Kawasaki, JP;
Inventor:
Osamu Hirose, Kawasaki, JP;
Assignee:
Ishida Co., Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
An X-ray inspection apparatus is provided with a shied box, a conveyor, an X-ray irradiator, an X-ray line sensor, a monitor, and a control computer to enable the apparatus to inspect an article by automatically selecting an appropriate image processing procedure that is most appropriate for the article. The control computer creates function blocks comprising an image forming section, an image processing procedure adoption determination unit, and a contaminant determination unit as a CPU loads various programs stored in a memory units such as HDD.