The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
Feb. 06, 2008
Osamu Hirose, Shiga, JP;
Osamu Hirose, Shiga, JP;
Ishida Co., Ltd., Kyoto, JP;
Abstract
A weight inspection apparatus includes a weight obtaining unit, an irradiation unit, a detection unit and an estimated weight calculation unit. The weight obtaining unit is configured to obtain an actual weight of an inspection target object. The irradiation unit is configured to irradiate the inspection target object with energy waves. The detection unit is configured to detect the energy waves irradiated at the inspection target object. The estimated weight calculation unit is configured to calculate an estimated weight of the inspection target object based on a result of detection by the detection unit. The deviation amount calculation unit is configured to calculate a difference between the actual weight obtained by the weight obtaining unit and the estimated weight obtained by the estimated weight calculation unit.