Location History:
- Tokyo, JP (2014)
- Mie-ken, JP (2015)
- Yokkaichi, JP (2016 - 2023)
Company Filing History:
Years Active: 2014-2024
Title: Nobuhito Kuge: Innovator in Semiconductor Technology
Introduction
Nobuhito Kuge is a prominent inventor based in Yokkaichi, Japan, known for his significant contributions to semiconductor technology. With a total of eight patents to his name, Kuge has made remarkable advancements in the field, particularly in the manufacturing and inspection of semiconductor devices.
Latest Patents
Kuge's latest patents include a semiconductor wafer and a method of manufacturing semiconductor apparatus. This semiconductor wafer features a surface with at least one recess that includes an inner wall surface, which is exposed. Another notable patent is for an apparatus designed for inspecting semiconductor devices. This apparatus includes an X-ray irradiation unit that directs monochromatic X-rays at a predetermined angle of incidence onto the semiconductor device. It also features a detection unit that captures observed X-rays using a variety of two-dimensionally arranged photodetection elements. The analysis apparatus generates X-ray diffraction images by photoelectrically converting the observed X-rays. Additionally, a control unit adjusts the angle of incidence and detection angle of the X-rays, allowing for the estimation of stress distribution within the object.
Career Highlights
Throughout his career, Nobuhito Kuge has worked with notable companies such as Toshiba Corporation and Toshiba Memory Corporation. His work in these organizations has significantly influenced the development of semiconductor technologies.
Collaborations
Kuge has collaborated with esteemed colleagues, including Naoki Yasuda and Yoshiaki Fukuzumi, contributing to various projects that have advanced semiconductor research and development.
Conclusion
Nobuhito Kuge's innovative work in semiconductor technology has established him as a key figure in the industry. His patents and collaborations reflect his commitment to advancing the field and improving semiconductor manufacturing and inspection processes.