Company Filing History:

19 out of 2,899

Seiko Instruments Inc

patents

1 out of 1,037

Agency of Industrial Science and Technology

patents

1 out of 832,680

Other

patents

where one patent can have more than one assignee

Years Active: 1992-2003

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20 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 6667467 - Microprobe and scanning probe apparatus having microprobe (2003-12-23),

2. 6664540 - Microprobe and sample surface measuring apparatus (2003-12-16),

3. 6469293 - Multiprobe and scanning probe microscope (2002-10-22),

4. 6422069 - Self-exciting and self-detecting probe and scanning probe apparatus (2002-07-23),

5. 6405583 - Correlation sample for scanning probe microscope and method of processing the correlation sample (2002-06-18),

6. 6388252 - Self-detecting type of SPM probe and SPM device (2002-05-14),

7. 6383823 - Probe for scanning probe microscope (SPM) and SPM device (2002-05-07),

8. 6358426 - Method of fabricating probe force atomic force microscope (2002-03-19),

9. 6211540 - Semiconductor strain sensor and scanning probe microscope using the semiconductor strain sensor (2001-04-03),

10. 6176122 - Cantilever unit and scanning probe microscope utilizing the cantilever unit (2001-01-23),

11. 6171437 - Semiconductor manufacturing device (2001-01-09),

12. 6049115 - Scanning probe microscope, and semiconductor distortion sensor for use (2000-04-11),

13. 5992225 - Cantilever probe and scanning type probe microscope utilizing the (1999-11-30),

14. 5877412 - Probe for atomic force microscope and atomic force microscope (1999-03-02),

15. 5825183 - Radial differential squid magnetic flux meter (1998-10-20),

Title: Nobuhiro Shimizu: A Pioneer in Microprobe Technology

Introduction

Nobuhiro Shimizu is a prominent inventor based in Chiba, Japan, known for his significant contributions to the field of microprobe technology. With an impressive portfolio of 20 patents, Shimizu has established himself as a leading figure in innovations that enhance the capabilities of surface measurement and analysis.

Latest Patents

Among his latest inventions, Nobuhiro Shimizu developed advanced microprobe and scanning probe apparatus designed for precision measurements. His patent titled "Microprobe and scanning probe apparatus having microprobe" describes a sophisticated cantilever system featuring a first lever portion with a free end and a second lever portion equipped with a piezoresistive element to facilitate accurate bending. Another notable patent, "Microprobe and sample surface measuring apparatus," showcases his ingenuity in creating tools that allow for highly detailed surface measurements, a critical advancement in various scientific applications.

Career Highlights

Shimizu's career has been marked by his work with notable organizations such as Seiko Instruments Inc. and the Agency of Industrial Science and Technology. His experiences in these esteemed institutions have equipped him with a deep understanding of technology development and application, further solidifying his reputation in the field of innovations.

Collaborations

Throughout his career, Nobuhiro Shimizu has collaborated with distinguished professionals, including Yoshiharu Shirakawabe and Hiroshi Takahashi. These partnerships have fostered a collaborative environment conducive to groundbreaking advancements in microprobe technology and surface measurement techniques.

Conclusion

Nobuhiro Shimizu's contributions to the field of microprobe technology and his extensive patent portfolio reflect his dedication to innovation and excellence. As he continues to develop cutting-edge solutions, Shimizu remains an influential figure in the world of inventions, inspiring future generations of inventors and researchers.

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