logo

For the Inventor, By the Inventor

Chiba, Japan

Nobuhiro Shimizu

This inventor holds 20 USPTO granted patents, primarily in Scanning Probe Microscopy. Top assignees: Seiko Instruments Inc, Agency of Industrial Science and Technology, Other. Active years: 1992-2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nobuhiro Shimizu. Retrieved from https://idiyas.com/inventor/nobuhiro-shimizu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 20

% Patents Active = 100.0

Average Co-Inventor Count = 3.2

ph-index = 9

Forward Citations = 183(Granted Patents)


Location History:

  • Tokyo, JP (1992 - 1996)
  • Chiba, JP (1998 - 2003)

Company Filing History:

goldMedal19 out of 2,903 
 
Seiko Instruments Inc
 patents
silverMedal1 out of 1,430 
 
Agency of Industrial Science and Technology
 patents
bronzeMedal1 out of 834,601 
Other
 patents
where one patent can have more than one assignee

Years Active: 1992-2003

Loading Chart...
Areas of Expertise:
Microprobe
Scanning Probe Microscope
Atomic Force Microscope
Semiconductor Strain Sensor
Cantilever Unit
Magnetic Field Detection
DC Superconducting Quantum Interference Device
Correlation Sample
Self-Detecting Probe
Fabrication Method
Probe Force
Highly Sensitive SQUID
20 patents (USPTO):Explore Patents
1. 6667467 - Microprobe and scanning probe apparatus having microprobe (2003-12-23),
2. 6664540 - Microprobe and sample surface measuring apparatus (2003-12-16),
3. 6469293 - Multiprobe and scanning probe microscope (2002-10-22),
4. 6422069 - Self-exciting and self-detecting probe and scanning probe apparatus (2002-07-23),
5. 6405583 - Correlation sample for scanning probe microscope and method of processing the correlation sample (2002-06-18),
6. 6388252 - Self-detecting type of SPM probe and SPM device (2002-05-14),
7. 6383823 - Probe for scanning probe microscope (SPM) and SPM device (2002-05-07),
8. 6358426 - Method of fabricating probe force atomic force microscope (2002-03-19),
9. 6211540 - Semiconductor strain sensor and scanning probe microscope using the semiconductor strain sensor (2001-04-03),
10. 6176122 - Cantilever unit and scanning probe microscope utilizing the cantilever unit (2001-01-23),
11. 6171437 - Semiconductor manufacturing device (2001-01-09),
12. 6049115 - Scanning probe microscope, and semiconductor distortion sensor for use (2000-04-11),
13. 5992225 - Cantilever probe and scanning type probe microscope utilizing the (1999-11-30),
14. 5877412 - Probe for atomic force microscope and atomic force microscope (1999-03-02),
15. 5825183 - Radial differential squid magnetic flux meter (1998-10-20),

Title: Nobuhiro Shimizu: A Pioneer in Microprobe Technology

Introduction

Nobuhiro Shimizu is a prominent inventor based in Chiba, Japan, known for his significant contributions to the field of microprobe technology. With an impressive portfolio of 20 patents, Shimizu has established himself as a leading figure in innovations that enhance the capabilities of surface measurement and analysis.

Latest Patents

Among his latest inventions, Nobuhiro Shimizu developed advanced microprobe and scanning probe apparatus designed for precision measurements. His patent titled "Microprobe and scanning probe apparatus having microprobe" describes a sophisticated cantilever system featuring a first lever portion with a free end and a second lever portion equipped with a piezoresistive element to facilitate accurate bending. Another notable patent, "Microprobe and sample surface measuring apparatus," showcases his ingenuity in creating tools that allow for highly detailed surface measurements, a critical advancement in various scientific applications.

Career Highlights

Shimizu's career has been marked by his work with notable organizations such as Seiko Instruments Inc. and the Agency of Industrial Science and Technology. His experiences in these esteemed institutions have equipped him with a deep understanding of technology development and application, further solidifying his reputation in the field of innovations.

Collaborations

Throughout his career, Nobuhiro Shimizu has collaborated with distinguished professionals, including Yoshiharu Shirakawabe and Hiroshi Takahashi. These partnerships have fostered a collaborative environment conducive to groundbreaking advancements in microprobe technology and surface measurement techniques.

Conclusion

Nobuhiro Shimizu's contributions to the field of microprobe technology and his extensive patent portfolio reflect his dedication to innovation and excellence. As he continues to develop cutting-edge solutions, Shimizu remains an influential figure in the world of inventions, inspiring future generations of inventors and researchers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…