This inventor holds 3 USPTO granted patents and 1 EPO patent. Top assignees: Jeol Ltd., Oriental Yeast Co., Ltd.. Active years: 2004-2008.
Company Filing History:
Years Active: 2004-2008
Title: Natsuko Nakamura: Innovator in Charged-Particle Beam Technology
Introduction
Natsuko Nakamura is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of charged-particle beam technology, holding a total of 3 patents. Her innovative work focuses on methods and apparatuses that enhance the precision and efficiency of charged-particle beams.
Latest Patents
Nakamura's latest patents include a "Method and apparatus for automatically correcting charged-particle beam" and a "Method of controlling aberration corrector for charged-particle beam." These inventions disclose a system that automatically corrects a charged-particle beam using an aberration corrector, eliminating the need for manual operations by the operator. The apparatus features an extraction portion that captures the beam profile from images of a sample's surface, a calculation unit that determines the axial deviation of the apparatus, and a feedback unit that applies corrections automatically based on the calculated deviation. Additionally, her patent on the "Automated method of correcting aberrations in electron beam" outlines a computer-based approach to correct various aberrations in the beam, including axis deviation, defocus, chromatic aberration, and aperture aberration.
Career Highlights
Throughout her career, Natsuko Nakamura has worked with notable companies such as Jeol Ltd. and Oriental Yeast Co., Ltd. Her experience in these organizations has allowed her to develop and refine her innovative technologies in charged-particle beam applications.
Collaborations
Nakamura has collaborated with esteemed colleagues, including Joachim Zach and Shinobu Uno. These partnerships have contributed to her success and the advancement of her inventions.
Conclusion
Natsuko Nakamura's contributions to charged-particle beam technology demonstrate her innovative spirit and dedication to advancing scientific knowledge. Her patents reflect her commitment to improving the efficiency and accuracy of charged-particle beam applications.