Seongnam, South Korea

Myung Jun Lee

This inventor holds 5 USPTO granted patents and 1 published patent application. Top assignees: Samsung Electronics Co., Ltd., Iucf-Hyu (Industry-University Cooperation, Samsung Electronics Ltd.. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Myung Jun Lee. Retrieved from https://idiyas.com/inventor/myung-jun-lee-q5clwr24

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 5 

% Patents Active = 80.0

Average Co-Inventor Count = 5.7

ph-index = 1


Company Filing History:


Years Active: 2024-2026

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5 patents (USPTO):Explore Patents

Title: Myung Jun Lee: Innovator in Optical Measurement Technology

Introduction

Myung Jun Lee is a prominent inventor based in Seongnam-si, South Korea. He has made significant contributions to the field of optical measurement technology, holding a total of 5 patents. His work focuses on developing advanced measurement apparatuses that enhance the precision and efficiency of semiconductor fabrication.

Latest Patents

Myung Jun Lee's latest patents include innovative technologies such as an optical measurement apparatus and methods for measuring and fabricating semiconductor devices. The optical measurement apparatus features a light source unit that generates and outputs light, a polarized light generating unit, and an optical system that creates a pupil image of a measurement target. Additionally, it includes a self-interference generating unit that produces multiple beams split from the pupil image, along with a detecting unit that captures the self-interference image created by the interference of these beams. Another patent describes a similar optical measurement apparatus that utilizes an optical system to generate a pupil image, a polarization generator for creating polarized light, and a self-interference generator that facilitates the interference of beams to produce a self-interference image. This technology is crucial for extracting phase data and optimizing the focus position of measurement targets.

Career Highlights

Myung Jun Lee is currently employed at Samsung Electronics Co., Ltd., where he continues to push the boundaries of optical measurement technology. His work has been instrumental in advancing the capabilities of semiconductor devices, which are essential for modern electronics.

Collaborations

He collaborates with talented colleagues such as Sung Ho Jang and Wook Rae Kim, contributing to a dynamic team focused on innovation and excellence in technology.

Conclusion

Myung Jun Lee's contributions to optical measurement technology and semiconductor fabrication are noteworthy. His patents reflect a commitment to advancing the field and improving measurement techniques. His work at Samsung Electronics Co., Ltd. continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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