The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Jan. 02, 2024
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Seung Ryeol Lee, Suwon-si, KR;
Ye Eun Park, Suwon-si, KR;
Jin Woo Ahn, Suwon-si, KR;
Seung Woo Lee, Suwon-si, KR;
Tae Joong Kim, Suwon-si, KR;
Myung Jun Lee, Suwon-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01); G01N 21/21 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0257 (2013.01); G01M 11/0207 (2013.01); G01M 11/0242 (2013.01); G01N 21/21 (2013.01); G01N 21/8806 (2013.01); G01N 2021/8845 (2013.01); G01N 2021/8848 (2013.01);
Abstract
Provided is an optical measurement apparatus. The optical measurement apparatus includes a light source; an objective lens; a reflector configured to change an optical path of light emitted from the light source such that the light is directed toward the objective lens; a detector configured to detect a pupil image; a first adjuster configured to rotate the light source around the reflector; and a second adjuster configured to rotate the reflector.