Nirasaki, Japan

Munetoshi Nagasaka



Average Co-Inventor Count = 2.3

ph-index = 5

Forward Citations = 645(Granted Patents)


Location History:

  • Yamanashi-ken, JP (1997)
  • Nirasaki, JP (2009 - 2016)
  • Yamanashi, JP (2017)

Company Filing History:


Years Active: 1997-2017

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14 patents (USPTO):Explore Patents

Title: Munetoshi Nagasaka: Innovator in Semiconductor Probe Technology

Introduction

Munetoshi Nagasaka is a prominent inventor based in Nirasaki, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 14 patents. His work primarily focuses on probe devices that enhance the efficiency and reliability of semiconductor testing.

Latest Patents

Nagasaka's latest patents include innovative designs for probe devices. One notable invention is a probe device that features an electrode plate positioned above a mounting table for semiconductor wafers. This device is electrically connected to a tester and includes a contact probe that has a uniquely designed contact portion. This portion is formed unevenly to ensure effective contact with the electrode plate. The device allows for vertical movement through a biasing member, facilitating connections between the semiconductor device and the tester.

Another significant patent involves a probe device equipped with a cleaning mechanism. This mechanism includes a polishing unit for maintaining the contact portion of the connection conductor, a brush cleaning unit for thorough cleaning, and a contact resistance measuring unit. This innovation ensures that the connection between the semiconductor device and the tester remains reliable and efficient.

Career Highlights

Throughout his career, Munetoshi Nagasaka has worked with notable companies in the semiconductor industry, including Tokyo Electron Limited and Tokyo Electron Yamanashi Limited. His experience in these organizations has contributed to his expertise in developing advanced probe technologies.

Collaborations

Nagasaka has collaborated with esteemed colleagues such as Ikuo Ogasawara and Eiichi Shinohara. These partnerships have fostered innovation and have played a crucial role in the development of his patented technologies.

Conclusion

Munetoshi Nagasaka's contributions to semiconductor probe technology are noteworthy, with a portfolio of 14 patents that reflect his innovative spirit. His work continues to influence the industry, enhancing the efficiency of semiconductor testing processes.

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