This inventor holds 3 USPTO granted patents. Top assignee: Intel Corporation. Active years: 2016-2018.
Company Filing History:
Years Active: 2016-2018
Title: Mladenko Vukic: Innovator in Integrated Circuit Testing
Introduction
Mladenko Vukic is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of integrated circuit testing, holding a total of 3 patents. His work focuses on enhancing the reliability and efficiency of electronic components.
Latest Patents
One of Mladenko's latest patents is titled "Pulsed testing of through-body-vias." This innovation involves an integrated circuit die that features one or more through-body-vias and an onboard testing circuit. The testing circuit identifies defects in a through-body-via by driving pulses of current into a node. The pulses are counted until the voltage of the node reaches a threshold voltage, providing a pulse count that reflects the capacitance of the node. This method allows for a determination of whether the through-body-via has a defect based on the pulse count.
Another significant patent is "Current tests for I/O interface connectors." This patent describes a testing method that includes applying forced energy to a first pin of an interface on a data communications bus of an integrated circuit. The energy caused by the forced energy is sensed at a second pin of the interface, and the forced energy is compared to the sensed energy to determine the amount of current leakage in the interface.
Career Highlights
Mladenko Vukic is currently employed at Intel Corporation, a leading technology company known for its innovations in semiconductor manufacturing. His work at Intel has allowed him to contribute to cutting-edge technologies in the electronics industry.
Collaborations
Mladenko has collaborated with talented coworkers such as Kalyan C Kolluru and Bharani Thiruvengadam. Their combined expertise has fostered advancements in integrated circuit testing methodologies.
Conclusion
Mladenko Vukic's contributions to integrated circuit testing through his innovative patents demonstrate his commitment to improving electronic component reliability. His work at Intel Corporation and collaborations with fellow inventors further highlight his impact in the field.