The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Jun. 29, 2012
Applicants:
Kalyan C. Kolluru, Portland, OR (US);
Mladenko Vukic, Portland, OR (US);
Inventors:
Kalyan C. Kolluru, Portland, OR (US);
Mladenko Vukic, Portland, OR (US);
Assignee:
INTEL CORPORATION, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H01L 25/065 (2006.01); H01L 21/66 (2006.01); G01R 31/312 (2006.01); H01L 23/48 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2851 (2013.01); G01R 31/312 (2013.01); H01L 22/14 (2013.01); H01L 25/0657 (2013.01); G01R 31/2853 (2013.01); H01L 23/481 (2013.01); H01L 2224/131 (2013.01); H01L 2224/13025 (2013.01); H01L 2224/16146 (2013.01); H01L 2224/16225 (2013.01); H01L 2224/16227 (2013.01);
Abstract
An integrated circuit die has one or more through-body-vias and a testing circuit on board the die which tests for defects in a through-body-via by driving of pulses of current into a node. Pulses are counted until the voltage of the node reaches a threshold voltage to provide a pulse count which is a function of the capacitance of the node. A determination is made as to whether the through-body-via of the node has a defect as a function of the pulse count.