The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2017
Filed:
Nov. 23, 2011
Applicants:
Bharani Thiruvengadam, Beaverton, OR (US);
Mladenko Vukic, Portland, OR (US);
Tak M. Mak, Union City, CA (US);
Inventors:
Bharani Thiruvengadam, Beaverton, OR (US);
Mladenko Vukic, Portland, OR (US);
Tak M. Mak, Union City, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 31/30 (2006.01); G01R 31/317 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2607 (2013.01); G01R 31/3008 (2013.01); G01R 31/31716 (2013.01); G01R 35/005 (2013.01);
Abstract
Current tests for I/O interface connectors are described. In one example a test may include applying a forced energy to a first pin of an interface of a data communications bus of an integrated circuit on a die, sensing the energy caused by the forced energy at a second pin of the interface, and comparing the forced energy and the sensed energy to determine an amount of current leaked by at least a portion of the interface.