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For the Inventor, By the Inventor

Kanagawa, Japan

Mitsuru Toishi

USPTO Granted Patents = 16

Average Co-Inventor Count = 1.9

ph-index = 4

Forward Citations = 35(Granted Patents)


Location History:

  • Tokyo, JP (2007 - 2012)
  • Kanagawa, JP (2010 - 2014)

Company Filing History:

goldMedal16 out of 58,129 
 
Sony Corporation
 patents

Years Active: 2007-2014

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16 patents (USPTO):
1. 8804120 - Fine particle analyzing apparatus and fine particle analyzing method (2014-08-12),
2. 8466435 - Fine particle measuring device (2013-06-18),
3. 8384045 - Minute particle analyzing device and method (2013-02-26),
4. 8350232 - Microparticle analysis device and microparticle analysis method (2013-01-08),
5. 8134765 - Hologram recording and reconstruction apparatus (2012-03-13),
6. 8072660 - Hologram recording apparatus and hologram reconstruction apparatus (2011-12-06),
7. 7965607 - Hologram recording/reproducing device and recording/reproducing optical apparatus (2011-06-21),
8. 7835049 - Reproducing apparatus and reproducing method (2010-11-16),
9. 7791779 - Hologram recording apparatus, hologram recording medium and hologram recording method (2010-09-07),
10. 7760611 - Hologram reproducing apparatus (2010-07-20),
11. 7633660 - Hologram recording apparatus and method (2009-12-15),
12. 7502151 - Holographic recording and reconstructing apparatus and method (2009-03-10),
13. 7394581 - Hologram recording apparatus and method (2008-07-01),
14. 7283286 - Hologram recording/reproducing device and optical unit (2007-10-16),
15. 7253934 - Holographic recording apparatus and method for recording holograms (2007-08-07),

Title: Mitsuru Toishi: Innovator in Fine Particle Analysis

Introduction

Mitsuru Toishi is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of fine particle analysis, holding a total of 16 patents. His innovative work has advanced the technology used in analyzing fine particles, which is crucial in various scientific and industrial applications.

Latest Patents

Toishi's latest patents include a fine particle analyzing apparatus and a fine particle analyzing method. The fine particle analyzing apparatus features a light irradiation unit that uses a laser beam to analyze fine particles flowing through a designated path. This apparatus includes a semiconductor laser light source, an optical fiber that transforms the laser beam into a top-hat type beam pattern, and a control unit that supplies a driving current to the light source. Additionally, his fine particle measuring device incorporates an optical filter divided into multiple areas, designed to enhance the detection of fluorescence while blocking unnecessary light components.

Career Highlights

Mitsuru Toishi has had a distinguished career at Sony Corporation, where he has been instrumental in developing advanced technologies for fine particle analysis. His work has not only contributed to the company's innovation portfolio but has also positioned Sony as a leader in this specialized field.

Collaborations

Toishi has collaborated with notable colleagues, including Atsushi Fukumoto and Mikio Sugiki. Their combined expertise has fostered a collaborative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Mitsuru Toishi's contributions to fine particle analysis exemplify the impact of innovative thinking in technology. His patents and work at Sony Corporation highlight his role as a key figure in advancing this important field.

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