The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2013

Filed:

Jul. 01, 2010
Applicants:

Koji Takasaki, Chiba, JP;

Katsuhiro Seo, Kanagawa, JP;

Mitsuru Toishi, Kanagawa, JP;

Shinji Yamada, Tokyo, JP;

Atsushi Fukumoto, Kanagawa, JP;

Gary Durack, Champaign, IL (US);

Inventors:

Koji Takasaki, Chiba, JP;

Katsuhiro Seo, Kanagawa, JP;

Mitsuru Toishi, Kanagawa, JP;

Shinji Yamada, Tokyo, JP;

Atsushi Fukumoto, Kanagawa, JP;

Gary Durack, Champaign, IL (US);

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A minute particle analyzing device includes: a light source; a first condenser lens for condensing light from the light source to a first end of a multimode optical fiber; a second condenser lens for condensing the light emerging from a second end of the multimode optical fiber to a minute particle; and a detector for detecting light generated from the minute particle by the application of the light from the light source.


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