The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Mar. 12, 2012
Hironobu Tanase, Tokyo, JP;
Mitsuru Toishi, Kanagawa, JP;
Hironobu Tanase, Tokyo, JP;
Mitsuru Toishi, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
A fine particle analyzing apparatus includes a light irradiation unit configured to irradiate a fine particle that flows in a flow path with a laser beam, and a detection unit configured to detect light emitted from the fine particle that is irradiated with the laser beam. In the fine particle analyzing apparatus, the light irradiation unit includes at least a light source that is composed of a semiconductor laser, an optical fiber that converts a beam pattern of the laser beam generated from the light source into a top-hat type beam pattern, and a light source driving control unit configured to supply driving current, which is obtained by superimposing high-frequency current on direct current, to the light source.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile