The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2013
Filed:
Jul. 12, 2011
Mitsuru Toishi, Kanagawa, JP;
Katsuhiro Seo, Kanagawa, JP;
Koji Takasaki, Chiba, JP;
Shinji Yamada, Kanagawa, JP;
Atsushi Fukumoto, Kanagawa, JP;
Mitsuru Toishi, Kanagawa, JP;
Katsuhiro Seo, Kanagawa, JP;
Koji Takasaki, Chiba, JP;
Shinji Yamada, Kanagawa, JP;
Atsushi Fukumoto, Kanagawa, JP;
Sony Corporation, Tokyo, JP;
Abstract
A fine particle measuring device includes an optical filter that is divided into a plurality of areas and is disposed on an optical path on which light emitted from a fine particle, which is irradiated with light, is guided to an optical detector. In the fine particle measuring device, the optical filter includes a first area having wavelength selectivity by which the first area blocks reflected light from the fine particle and an unnecessary scattered light component and transmits fluorescence, and a second area that is disposed around at least the first area and has no wavelength selectivity so as to transmit a necessary scattered light component.