The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8350232 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 08, 2013

Filed:

Jan. 31, 2011
Applicants:

Atsushi Fukumoto, Kanagawa, JP;

Mitsuru Toishi, Kanagawa, JP;

Inventors:

Atsushi Fukumoto, Kanagawa, JP;

Mitsuru Toishi, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed herein is a microparticle analysis device including: a light source configured to irradiate a microparticle with light; an acousto-optic modulator configured to diffract fluorescence generated from the microparticle due to the light irradiation; a slit configured to allow transmission of only diffracted light in a diffraction center wavelength region among diffracted light beams from the acousto-optic modulator; and a detector configured to detect the diffracted light in the diffraction center wavelength region transmitted through the slit.


Find Patent Forward Citations

Fukumoto, Atsushi. (2013). Microparticle analysis device and microparticle analysis method (U.S. Patent No. 8350232). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8350232

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