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For the Inventor, By the Inventor

Zhudong, Taiwan

Ming-Yi Lee

This inventor holds 9 USPTO granted patents. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2001-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ming-Yi Lee. Retrieved from https://idiyas.com/inventor/ming-yi-lee-rk0ym4fd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 9

% Patents Active = 77.8

Average Co-Inventor Count = 3.7

ph-index = 3

Forward Citations = 37(Granted Patents)


Location History:

  • Chia-yi, TW (2001)
  • Chin-Yi, TW (2003)
  • Taoyuan, TW (2005)
  • Zhudong Township, TW (2013 - 2016)
  • Xin Zhu Shi, TW (2015 - 2017)

Company Filing History:

goldMedal9 out of 42,872 
 
Taiwan Semiconductor Manufacturing Comp. Ltd.
 patents

Years Active: 2001-2017

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9 patents (USPTO):Explore Patents
1. 9734572 - System and method for defect analysis of a substrate (2017-08-15),
2. 9449656 - Memory with bit cell header transistor (2016-09-20),
3. 9412742 - Layout design for manufacturing a memory cell (2016-08-09),
4. 8965102 - System and method for defect analysis of a substrate (2015-02-24),
5. 8665654 - Memory edge cell (2014-03-04),
6. 8482990 - Memory edge cell (2013-07-09),
7. 6916700 - Mixed-mode process (2005-07-12),
8. 6604257 - Apparatus and method for cleaning a conduit (2003-08-12),
9. 6315649 - Wafer mounting plate for a polishing apparatus and method of using (2001-11-13),

Title: Innovator Spotlight: Ming-Yi Lee's Trailblazing Path in Patenting

Introduction: Ming-Yi Lee, a distinguished inventor hailing from Zhudong Township, TW, has made waves in the realm of innovation with his impressive portfolio of 9 patents. His latest patents showcase his ingenuity and commitment to advancing technology in various fields.

Latest Patents:

1. System and Method for Defect Analysis of a Substrate: Lee's groundbreaking method involves utilizing two images, one of a substrate with a defect and another of a reference substrate, to determine differences and simulate a curve for defect analysis and dispositioning.

2. Memory with Bit Cell Header Transistor: Lee's memory design includes bit cells with header PMOS transistors that enhance write operation efficiency by being partially turned off with a control signal.

Career Highlights: Ming-Yi Lee is an esteemed member of Taiwan Semiconductor Manufacturing Company Limited (TSMC), a leading semiconductor manufacturer known for its cutting-edge technology and global impact. Within TSMC, Lee has made significant contributions to the field of memory design and defect analysis.

Collaborations: Lee's collaborative efforts with coworkers Hung-Jen Liao and Chi-Hung Liao have further amplified the impact of his inventions. Together, they have exemplified teamwork and innovation at its finest, propelling the field of semiconductor technology forward.

Conclusion: Ming-Yi Lee's remarkable dedication to innovation and patenting has solidified his legacy as a visionary inventor. His relentless pursuit of excellence and collaborative spirit serve as a beacon of inspiration for aspiring inventors worldwide, leaving an enduring mark on the landscape of technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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