Ming-Tung Chang

Title: The Innovations of Ming-Tung Chang

Introduction

Ming-Tung Chang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of integrated circuit design, holding a total of 2 patents. His work focuses on enhancing the efficiency and functionality of semiconductor technologies.

Latest Patents

Ming-Tung Chang's latest patents include a "Through Silicon Via Testing Structure." This invention features a testing structure that incorporates multiple controllers, transmitters, and receivers. The controllers are designed to output controlling signals, while the transmitters and receivers facilitate the testing process through the silicon via. Another significant patent is the "Method for Creating Test Clock Domain During Integrated Circuit Design." This method involves determining the need for test clock domain adjustments based on the arrangement of scan cells within the integrated circuit layout.

Career Highlights

Throughout his career, Ming-Tung Chang has worked with prominent organizations such as Global Unichip Corporation and National Taiwan University. His experience in these institutions has allowed him to develop innovative solutions in the semiconductor industry.

Collaborations

Ming-Tung Chang has collaborated with esteemed colleagues, including Min-Hsiu Tsai and Chih-Mou Tseng. These partnerships have contributed to the advancement of his research and inventions.

Conclusion

Ming-Tung Chang's contributions to integrated circuit design and semiconductor technology are noteworthy. His innovative patents and collaborations reflect his commitment to advancing the field.