Location History:
- Tokyo, JE (2017)
- Tokyo, JP (2018 - 2024)
Company Filing History:
Years Active: 2017-2025
Title: Minami Shouji: Innovator in Semiconductor Technology
Introduction
Minami Shouji is a prominent inventor based in Tokyo, Japan, known for his significant contributions to semiconductor technology. With a total of eight patents to his name, Shouji has made remarkable advancements in the field, particularly in the development of inspection devices and charged particle beam devices.
Latest Patents
Shouji's latest patents include a semiconductor inspection device and a method for inspecting semiconductor samples. This innovative device features a first measurement mode and a second measurement mode, incorporating an electron optical system that irradiates a sample with an electron beam, along with an optical system that uses light. The device is equipped with an electron detector to capture signal electrons and a photodetector for signal light. A control unit manages the operation of both systems, allowing for different irradiation conditions in each measurement mode. Additionally, Shouji has developed a charged particle beam device aimed at enhancing the contrast of observation images of samples. This device adjusts optical parameters, such as the polarization plane of light, to optimize the light absorption characteristics of the sample.
Career Highlights
Throughout his career, Minami Shouji has worked with notable companies, including Hitachi High-Tech Corporation and Hitachi High-Technologies Corporation. His work in these organizations has allowed him to refine his expertise in semiconductor technologies and contribute to various innovative projects.
Collaborations
Shouji has collaborated with talented individuals in his field, including Natsuki Tsuno and Yasuhiro Shirasaki. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.
Conclusion
Minami Shouji's contributions to semiconductor technology through his patents and collaborations highlight his role as a key innovator in the industry. His work continues to influence advancements in semiconductor inspection and charged particle beam devices.